Measurement of the Lengthening Kinetics of Vertically Aligned Nanostructures by Spatiotemporal Mapping of Height and Orientation

Abstract

Owing to their inherent tortuosity, the collective height of vertically aligned nanostructures does not equal the average length of the individual constituent nanostructures, and therefore temporal height measurement is not an accurate measure of the genuine growth kinetics. We use high-resolution spatial mapping of alignment by small-angle X-ray scattering (SAXS) to transform real-time measurements of array height to the average length of the nanostructures. Applying this approach to carbon nanotube (CNT) forest growth transforms the kinetics from a sub-linear to a linear relationship with time, highlighting the potential for insights into the limiting growth mechanisms of CNTs and other one-dimensional nanostructures.